A Short Introduction to Method Verification and Validation

Specialism: Specialist

Skill Level: Intermediate Level

Delivery Method: e-Learning

Duration: Approx. 45 mins

Course Status: Available

Price: Free

Course description

Measurement reproducibility is critical to ensuring the quality of services as well as product manufacturing and performance. The lack in replicability and reproducibility in science has been denounced in recent years as a major stumbling block to research innovation. The ability to demonstrate measurements are valid and reproducible is therefore critical in enabling the confident uptake of measurement methods within quality frameworks and more broadly in R&D. There are many avenues to building confidence in measurement methods and this course will explore some of them.

Who is it for?

This course is aimed at instrument manufacturers, instrument vendors and measurement providers (including R&D and QC/QA labs) seeking to demonstrate ability and assess performance of their analytical instrumentation for specific applications.

Further Information

Certificate Type: NPL Certificate of Completion
Available as open course: Yes
Available as in-house course: No

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Introduction to Measurement and Metrology

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Introduction to Measurement Uncertainty

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Measuring the Surface Chemistry of Nanoparticles Using XPS

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Metrology for Nanoscale Imaging in Biology

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Learning outcomes

  • Understand the concepts of method validation and method verification
  • Understand key terms relating to measurement and metrology – the science of measurement and its application
  • Be aware of the available routes to method validation and verification
  • Be aware of the reference documentation and support networks available

Date(s) of next course

Available at any time

Register

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Queries

For further queries relating to both classroom and e-learning courses, please submit your details below, or contact us on 020 8943 6606.

    Related courses

    Introduction to Measurement and Metrology

    Entry Level

    Introduction to Measurement Uncertainty

    Entry Level

    Measuring the Surface Chemistry of Nanoparticles Using XPS

    Entry Level

    Metrology for Nanoscale Imaging in Biology

    Intermediate Level